Tabular processor for X-ray diffractometry


The program RTP is intended for the specialists in the area of X-ray analysis of crystal materials in various directions of science and technology. It allows to calculate the crystal lattice parameters (lattice constants) for syngonies from cubic to triclinic and also allows to calculate the reflexes positions for known parameters and diffraction indices. In addition, it has an indexing feature — determination the indices using shuffle technique for lattices up to monoclinic with unknown parameters, if the assumptions of lattice type and possible limits on indices and parameters do exist.

Technical characteristics

System requirements

Win32 version: Windows XP or later
(Windows 7 or later is highly recommended).
Monospaced font: Lucida Console 12...16 pt.

The screen of program RTP 4.6

Help and documentation

Examples of calculations


The main archive contains the version of the program for Windows XP or later (RTP32.EXE, RTP.CHM, RTPWL.INI). Another archive includes the test examples, which contain the tables of diffraction lines of various samples or the data taken from PDF for calculation the parameters; examples are especially useful to understand the indexing process.

namesizewhat contains
rtp32.cab164 862 RTP 4.7 for Win32, build 2023-09-14 (yyyy-mm-dd)
samples.cab5 490 examples of calculations

Remark: you can unpack the cab archives using the Explorer or the program extrac32.exe.